Rick Kendrick, Eric H. Smith, David N. Christie, David A. Bennett, David Theil, Eamon B. Barrett. Multiple-Aperture Imaging Spectrometer: Computer Simulation and Experimental Validation. In 33rd Applied Image Pattern Recognition Workshop (AIPR 2004), Emerging Technologies and Applications for Imagery Pattern Recognition, 13-15 October 2004, Washington, DC, USA, Proceedings. pages 3-9, IEEE Computer Society, 2004. [doi]
@inproceedings{KendrickSCBTB04,
title = {Multiple-Aperture Imaging Spectrometer: Computer Simulation and Experimental Validation},
author = {Rick Kendrick and Eric H. Smith and David N. Christie and David A. Bennett and David Theil and Eamon B. Barrett},
year = {2004},
doi = {10.1109/AIPR.2004.32},
url = {http://doi.ieeecomputersociety.org/10.1109/AIPR.2004.32},
researchr = {https://researchr.org/publication/KendrickSCBTB04},
cites = {0},
citedby = {0},
pages = {3-9},
booktitle = {33rd Applied Image Pattern Recognition Workshop (AIPR 2004), Emerging Technologies and Applications for Imagery Pattern Recognition, 13-15 October 2004, Washington, DC, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-2250-5},
}