Rick Kendrick, Eric H. Smith, David N. Christie, David A. Bennett, David Theil, Eamon B. Barrett. Multiple-Aperture Imaging Spectrometer: Computer Simulation and Experimental Validation. In 33rd Applied Image Pattern Recognition Workshop (AIPR 2004), Emerging Technologies and Applications for Imagery Pattern Recognition, 13-15 October 2004, Washington, DC, USA, Proceedings. pages 3-9, IEEE Computer Society, 2004. [doi]
Abstract is missing.