T. F. Kennedy, Robert S. Provence, James L. Broyan, Patrick W. Fink, Phong H. Ngo, Lazaro D. Rodriguez. Topic models for RFID data modeling and localization. In Jian-Yun Nie, Zoran Obradovic, Toyotaro Suzumura, Rumi Ghosh, Raghunath Nambiar, Chonggang Wang, Hui Zang, Ricardo A. Baeza-Yates, Xiaohua Hu, Jeremy Kepner, Alfredo Cuzzocrea, Jian Tang, Masashi Toyoda, editors, 2017 IEEE International Conference on Big Data, BigData 2017, Boston, MA, USA, December 11-14, 2017. pages 1438-1446, IEEE, 2017. [doi]
Abstract is missing.