Daulet Kenzhebalin, Xing Liu, Ni Yan, Peter Bauer, Jerry Wagner, Jan P. Allebach. Detection of streaks caused by dust in the sheetfed scanners. In Robin B. Jenkin, Elaine Jin, editors, Image Quality and System Performance XIV, Electronic Imaging 2017, IQSP, Burlingame, CA, USA, 29 January - 2 February 2017. pages 159-165, Ingenta, 2017. [doi]
Abstract is missing.