ESD protection design in a 0.18-um salicide CMOS technology by using substrate-triggered technique

Ming-Dou Ker, Tung-Yang Chen, Chung-Yu Win. ESD protection design in a 0.18-um salicide CMOS technology by using substrate-triggered technique. In International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia. pages 754-757, IEEE, 2001. [doi]

Abstract

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