A. Kerber, L. Pantisano, A. Veloso, Guido Groeseneken, M. Kerber. Reliability screening of high-k dielectrics based on voltage ramp stress. Microelectronics Reliability, 47(4-5):513-517, 2007. [doi]
@article{KerberPVGK07,
title = {Reliability screening of high-k dielectrics based on voltage ramp stress},
author = {A. Kerber and L. Pantisano and A. Veloso and Guido Groeseneken and M. Kerber},
year = {2007},
doi = {10.1016/j.microrel.2007.01.030},
url = {http://dx.doi.org/10.1016/j.microrel.2007.01.030},
tags = {rule-based, reliability},
researchr = {https://researchr.org/publication/KerberPVGK07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {4-5},
pages = {513-517},
}