Feature sensitive bas relief generation

Jens Kerber, Art Tevs, Alexander G. Belyaev, Rhaleb Zayer, Hans-Peter Seidel. Feature sensitive bas relief generation. In Jun-Hai Yong, Michela Spagnuolo, Wenping Wang, editors, IEEE International Conference on Shape Modeling and Applications, SMI 2009, Beijing, China, 26-28 June 2009. pages 148-154, IEEE Computer Society, 2009. [doi]

Abstract

Abstract is missing.