Arbitrary Error Detection in Combinational Circuits by Using Partitioning - researchr publication authors

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Osnat Keren, Ilya Levin, Vladimir Ostrovsky, Beni Abramov. Arbitrary Error Detection in Combinational Circuits by Using Partitioning. In Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, Mohammad Tehranipoor, editors, 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA. pages 361-369, IEEE Computer Society, 2008. [doi]

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Ilya Levin

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