Hans G. Kerkhoff, H. Ebrahimi. Intermittent Resistive Faults in Digital CMOS Circuits. In Zoran Stamenkovic, Witold A. Pleskacz, Jaan Raik, Heinrich Theodor Vierhaus, editors, 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2015, Belgrade, Serbia, April 22-24, 2015. pages 211-216, IEEE, 2015. [doi]
Abstract is missing.