Hans G. Kerkhoff, Arun A. Joseph, Sander Heuvelmans. Testable Design and Testing of High-Speed Superconductor Microelectronics. In 1st IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2002), 29-31 January 2002, Christchurch, New Zealand. pages 8-12, IEEE Computer Society, 2002. [doi]
Abstract is missing.