Hans G. Kerkhoff, Han Speek, M. Shashani, Manoj Sachdev. Design for Delay Testability in High-Speed Digital ICs. J. Electronic Testing, 17(3-4):225-231, 2001. [doi]
@article{KerkhoffSSS01,
title = {Design for Delay Testability in High-Speed Digital ICs},
author = {Hans G. Kerkhoff and Han Speek and M. Shashani and Manoj Sachdev},
year = {2001},
doi = {10.1023/A:1012207210784},
url = {http://dx.doi.org/10.1023/A:1012207210784},
tags = {testing, design},
researchr = {https://researchr.org/publication/KerkhoffSSS01},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {17},
number = {3-4},
pages = {225-231},
}