Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek, Nur Engin. MISMATCH: a basis for semi-automatic functional mixed-signal test-pattern generation. In Proceedings of Third International Conference on Electronics, Circuits, and Systems, ICECS 1996, Rodos, Greece, October 13-16, 1996. pages 1072-1075, IEEE, 1996. [doi]
Abstract is missing.