Daniel Keysers, Roberto Paredes, Enrique Vidal, Hermann Ney. Comparison of Log-linear Models and Weighted Dissimilarity Measures. In Francisco J. Perales López, Aurélio C. Campilho, Nicolas Pérez de la Blanca, Alberto Sanfeliu, editors, Pattern Recognition and Image Analysis, First Iberian Conference, IbPRIA 2003, Puerto de Andratx, Mallorca, Spain, June 4-6, 2003, Proceedings. Volume 2652 of Lecture Notes in Computer Science, pages 370-377, Springer, 2003. [doi]
@inproceedings{KeysersPVN03,
title = {Comparison of Log-linear Models and Weighted Dissimilarity Measures},
author = {Daniel Keysers and Roberto Paredes and Enrique Vidal and Hermann Ney},
year = {2003},
url = {http://springerlink.metapress.com/openurl.asp?genre=article&issn=0302-9743&volume=2652&spage=370},
researchr = {https://researchr.org/publication/KeysersPVN03},
cites = {0},
citedby = {0},
pages = {370-377},
booktitle = {Pattern Recognition and Image Analysis, First Iberian Conference, IbPRIA 2003, Puerto de Andratx, Mallorca, Spain, June 4-6, 2003, Proceedings},
editor = {Francisco J. Perales López and Aurélio C. Campilho and Nicolas Pérez de la Blanca and Alberto Sanfeliu},
volume = {2652},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {3-540-40217-9},
}