Daniel Keysers, Roberto Paredes, Enrique Vidal, Hermann Ney. Comparison of Log-linear Models and Weighted Dissimilarity Measures. In Francisco J. Perales López, Aurélio C. Campilho, Nicolas Pérez de la Blanca, Alberto Sanfeliu, editors, Pattern Recognition and Image Analysis, First Iberian Conference, IbPRIA 2003, Puerto de Andratx, Mallorca, Spain, June 4-6, 2003, Proceedings. Volume 2652 of Lecture Notes in Computer Science, pages 370-377, Springer, 2003. [doi]
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