Marzieh Khakifirooz, Mahdi Fathi. How particle detector can aid visual inspection for defect detection of TFT-LCD manufacturing. In Monica Tentori, Nadir Weibel, Kristof Van Laerhoven, Gregory D. Abowd, Flora D. Salim, editors, UbiComp/ISWC '20: 2020 ACM International Joint Conference on Pervasive and Ubiquitous Computing and 2020 ACM International Symposium on Wearable Computers, Virtual Event, Mexico, September 12-17, 2020. pages 547-552, ACM, 2020. [doi]
@inproceedings{KhakifiroozF20,
title = {How particle detector can aid visual inspection for defect detection of TFT-LCD manufacturing},
author = {Marzieh Khakifirooz and Mahdi Fathi},
year = {2020},
doi = {10.1145/3410530.3414596},
url = {https://doi.org/10.1145/3410530.3414596},
researchr = {https://researchr.org/publication/KhakifiroozF20},
cites = {0},
citedby = {0},
pages = {547-552},
booktitle = {UbiComp/ISWC '20: 2020 ACM International Joint Conference on Pervasive and Ubiquitous Computing and 2020 ACM International Symposium on Wearable Computers, Virtual Event, Mexico, September 12-17, 2020},
editor = {Monica Tentori and Nadir Weibel and Kristof Van Laerhoven and Gregory D. Abowd and Flora D. Salim},
publisher = {ACM},
isbn = {978-1-4503-8076-8},
}