Test Methodologies and Test-Time Compression for Emerging Non-Volatile Memory

Mohammad Nasim Imtiaz Khan, Swaroop Ghosh. Test Methodologies and Test-Time Compression for Emerging Non-Volatile Memory. IEEE Transactions on Reliability, 69(4):1387-1397, 2020. [doi]

Authors

Mohammad Nasim Imtiaz Khan

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Swaroop Ghosh

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