Mohammad Nasim Imtiaz Khan, Swaroop Ghosh. Test Methodologies and Test-Time Compression for Emerging Non-Volatile Memory. IEEE Transactions on Reliability, 69(4):1387-1397, 2020. [doi]
@article{KhanG20-5,
title = {Test Methodologies and Test-Time Compression for Emerging Non-Volatile Memory},
author = {Mohammad Nasim Imtiaz Khan and Swaroop Ghosh},
year = {2020},
doi = {10.1109/TR.2019.2919466},
url = {https://doi.org/10.1109/TR.2019.2919466},
researchr = {https://researchr.org/publication/KhanG20-5},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {69},
number = {4},
pages = {1387-1397},
}