Muhammad Aamir Khan, Hans G. Kerkhoff. Monitoring operating temperature and supply voltage in achieving high system dependability. In Proceedings of the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, 26-28 March, 2013, Abu Dhabi, UAE. pages 108-112, IEEE, 2013. [doi]
Abstract is missing.