Nguyen Ngoc Mai Khanh, Shigeru Nakajima, Tetsuya Iizuka, Yoshio Mita, Kunihiro Asada. Noninvasive Localization of IGBT Faults by High-Sensitivity Magnetic Probe With RF Stimulation. IEEE T. Instrumentation and Measurement, 67(4):745-753, 2018. [doi]
@article{KhanhNIMA18,
title = {Noninvasive Localization of IGBT Faults by High-Sensitivity Magnetic Probe With RF Stimulation},
author = {Nguyen Ngoc Mai Khanh and Shigeru Nakajima and Tetsuya Iizuka and Yoshio Mita and Kunihiro Asada},
year = {2018},
doi = {10.1109/TIM.2017.2789038},
url = {https://doi.org/10.1109/TIM.2017.2789038},
researchr = {https://researchr.org/publication/KhanhNIMA18},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {67},
number = {4},
pages = {745-753},
}