Rafik Kheddam, Oum-El-Kheir Aktouf, Ioannis Parissis. An Extended LLRP Model for RFID System Test and Diagnosis. In Giuliano Antoniol, Antonia Bertolino, Yvan Labiche, editors, 2012 IEEE Fifth International Conference on Software Testing, Verification and Validation, Montreal, QC, Canada, April 17-21, 2012. pages 529-538, IEEE, 2012. [doi]
@inproceedings{KheddamAP12,
title = {An Extended LLRP Model for RFID System Test and Diagnosis},
author = {Rafik Kheddam and Oum-El-Kheir Aktouf and Ioannis Parissis},
year = {2012},
doi = {10.1109/ICST.2012.138},
url = {http://doi.ieeecomputersociety.org/10.1109/ICST.2012.138},
researchr = {https://researchr.org/publication/KheddamAP12},
cites = {0},
citedby = {0},
pages = {529-538},
booktitle = {2012 IEEE Fifth International Conference on Software Testing, Verification and Validation, Montreal, QC, Canada, April 17-21, 2012},
editor = {Giuliano Antoniol and Antonia Bertolino and Yvan Labiche},
publisher = {IEEE},
isbn = {978-1-4577-1906-6},
}