Rafik Kheddam, Oum-El-Kheir Aktouf, Ioannis Parissis. An Extended LLRP Model for RFID System Test and Diagnosis. In Giuliano Antoniol, Antonia Bertolino, Yvan Labiche, editors, 2012 IEEE Fifth International Conference on Software Testing, Verification and Validation, Montreal, QC, Canada, April 17-21, 2012. pages 529-538, IEEE, 2012. [doi]
Abstract is missing.