Rabeb Kheriji, V. Danelon, Jean-Louis Carbonéro, Salvador Mir. Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 170-171, IEEE Computer Society, 2005. [doi]
Abstract is missing.