Critical hazard free test generation for asynchronous circuits

Ajay Khoche, Erik Brunvand. Critical hazard free test generation for asynchronous circuits. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 203-209, IEEE Computer Society, 1997. [doi]

Authors

Ajay Khoche

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Erik Brunvand

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