Ajay Khoche, Erik Brunvand. Critical hazard free test generation for asynchronous circuits. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 203-209, IEEE Computer Society, 1997. [doi]
@inproceedings{KhocheB97:0,
title = {Critical hazard free test generation for asynchronous circuits},
author = {Ajay Khoche and Erik Brunvand},
year = {1997},
url = {http://csdl.computer.org/comp/proceedings/vts/1997/7810/00/78100203abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/KhocheB97%3A0},
cites = {0},
citedby = {0},
pages = {203-209},
booktitle = {15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA},
publisher = {IEEE Computer Society},
}