Foutse Khomh, Brian Chan, Ying Zou, Anand Sinha, Dave Dietz. Predicting post-release defects using pre-release field testing results. In IEEE 27th International Conference on Software Maintenance, ICSM 2011, Williamsburg, VA, USA, September 25-30, 2011. pages 253-262, IEEE, 2011. [doi]
@inproceedings{KhomhCZSD11,
title = {Predicting post-release defects using pre-release field testing results},
author = {Foutse Khomh and Brian Chan and Ying Zou and Anand Sinha and Dave Dietz},
year = {2011},
doi = {10.1109/ICSM.2011.6080792},
url = {http://dx.doi.org/10.1109/ICSM.2011.6080792},
researchr = {https://researchr.org/publication/KhomhCZSD11},
cites = {0},
citedby = {0},
pages = {253-262},
booktitle = {IEEE 27th International Conference on Software Maintenance, ICSM 2011, Williamsburg, VA, USA, September 25-30, 2011},
publisher = {IEEE},
isbn = {978-1-4577-0663-9},
}