Foutse Khomh, Brian Chan, Ying Zou, Anand Sinha, Dave Dietz. Predicting post-release defects using pre-release field testing results. In IEEE 27th International Conference on Software Maintenance, ICSM 2011, Williamsburg, VA, USA, September 25-30, 2011. pages 253-262, IEEE, 2011. [doi]
Abstract is missing.