Detecting PII Leakage Using DPI and Machine Learning in an Enterprise Environment

Luka Khorkheli, David Bourne, Gandeva B. Satrya. Detecting PII Leakage Using DPI and Machine Learning in an Enterprise Environment. In Yevgeni Koucheryavy, Ahmed Aziz, editors, Internet of Things, Smart Spaces, and Next Generation Networks and Systems - 23rd International Conference, NEW2AN 2023, and 16th Conference, ruSMART 2023, Dubai, United Arab Emirates, December 21-22, 2023, Proceedings, Part I. Volume 14542 of Lecture Notes in Computer Science, pages 27-36, Springer, 2023. [doi]

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