Dynamic On-State Resistance Characterization of GaN FET under Hard-Switching Conditions - researchr publication authors

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Shima Khoshzaman, Yikai Tang, Ingo Hahn. Dynamic On-State Resistance Characterization of GaN FET under Hard-Switching Conditions. In IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021. pages 1-5, IEEE, 2021. [doi]

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