Shima Khoshzaman, Yikai Tang, Ingo Hahn. Dynamic On-State Resistance Characterization of GaN FET under Hard-Switching Conditions. In IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021. pages 1-5, IEEE, 2021. [doi]
@inproceedings{KhoshzamanTH21, title = {Dynamic On-State Resistance Characterization of GaN FET under Hard-Switching Conditions}, author = {Shima Khoshzaman and Yikai Tang and Ingo Hahn}, year = {2021}, doi = {10.1109/IECON48115.2021.9589413}, url = {https://doi.org/10.1109/IECON48115.2021.9589413}, researchr = {https://researchr.org/publication/KhoshzamanTH21}, cites = {0}, citedby = {0}, pages = {1-5}, booktitle = {IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021}, publisher = {IEEE}, isbn = {978-1-6654-3554-3}, }