Ushik Shrestha Khwakhali, Nguyen Thu Tra, Huynh Vinh Tin, Truong Duc Khai, Chung Quan Tin, Loh Ing Hoe. Fabric Defect Detection Using Gray Level Co-occurence Matrix and Local Binary Pattern. In RIVF International Conference on Computing and Communication Technologies, RIVF 2022, Ho Chi Minh City, Vietnam, December 20-22, 2022. pages 226-231, IEEE, 2022. [doi]
@inproceedings{KhwakhaliTTKTH22,
title = {Fabric Defect Detection Using Gray Level Co-occurence Matrix and Local Binary Pattern},
author = {Ushik Shrestha Khwakhali and Nguyen Thu Tra and Huynh Vinh Tin and Truong Duc Khai and Chung Quan Tin and Loh Ing Hoe},
year = {2022},
doi = {10.1109/RIVF55975.2022.10013920},
url = {https://doi.org/10.1109/RIVF55975.2022.10013920},
researchr = {https://researchr.org/publication/KhwakhaliTTKTH22},
cites = {0},
citedby = {0},
pages = {226-231},
booktitle = {RIVF International Conference on Computing and Communication Technologies, RIVF 2022, Ho Chi Minh City, Vietnam, December 20-22, 2022},
publisher = {IEEE},
isbn = {978-1-6654-6166-5},
}