Ushik Shrestha Khwakhali, Nguyen Thu Tra, Huynh Vinh Tin, Truong Duc Khai, Chung Quan Tin, Loh Ing Hoe. Fabric Defect Detection Using Gray Level Co-occurence Matrix and Local Binary Pattern. In RIVF International Conference on Computing and Communication Technologies, RIVF 2022, Ho Chi Minh City, Vietnam, December 20-22, 2022. pages 226-231, IEEE, 2022. [doi]
Abstract is missing.