Takeshi Kida, Yasumasa Tsukamoto, Yuji Kihara. Optimization of importance sampling Monte Carlo using consecutive mean-shift method and its application to SRAM dynamic stability analysis. In Keith A. Bowman, Kamesh V. Gadepally, Pallab Chatterjee, Mark M. Budnik, Lalitha Immaneni, editors, Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012. pages 572-579, IEEE, 2012. [doi]
Abstract is missing.