Bradley T. Kiddie, William H. Robinson, Daniel B. Limbrick. Single-Event Multiple-Transient Characterization and Mitigation via Alternative Standard Cell Placement Methods. ACM Trans. Design Autom. Electr. Syst., 20(4):60, 2015. [doi]
@article{KiddieRL15,
title = {Single-Event Multiple-Transient Characterization and Mitigation via Alternative Standard Cell Placement Methods},
author = {Bradley T. Kiddie and William H. Robinson and Daniel B. Limbrick},
year = {2015},
doi = {10.1145/2740962},
url = {http://doi.acm.org/10.1145/2740962},
researchr = {https://researchr.org/publication/KiddieRL15},
cites = {0},
citedby = {0},
journal = {ACM Trans. Design Autom. Electr. Syst.},
volume = {20},
number = {4},
pages = {60},
}