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Single-Event Multiple-Transient Characterization and Mitigation via Alternative Standard Cell Placement Methods

Bradley T. Kiddie, William H. Robinson, Daniel B. Limbrick. Single-Event Multiple-Transient Characterization and Mitigation via Alternative Standard Cell Placement Methods. ACM Trans. Design Autom. Electr. Syst., 20(4):60, 2015. [doi]

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