Takashi Kido. In-Process Inspection Technique for Active-Matrix LCD Panels. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 795-799, IEEE Computer Society, 1992.
@inproceedings{Kido92,
title = {In-Process Inspection Technique for Active-Matrix LCD Panels},
author = {Takashi Kido},
year = {1992},
researchr = {https://researchr.org/publication/Kido92},
cites = {0},
citedby = {0},
pages = {795-799},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}