Christian Kier, Til Aach. Predicting the benefit of sample size extension in multiclass k-NN classification. In 18th International Conference on Pattern Recognition (ICPR 2006), 20-24 August 2006, Hong Kong, China. pages 332-335, IEEE Computer Society, 2006. [doi]
@inproceedings{KierA06, title = {Predicting the benefit of sample size extension in multiclass k-NN classification}, author = {Christian Kier and Til Aach}, year = {2006}, doi = {10.1109/ICPR.2006.942}, url = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2006.942}, tags = {classification}, researchr = {https://researchr.org/publication/KierA06}, cites = {0}, citedby = {0}, pages = {332-335}, booktitle = {18th International Conference on Pattern Recognition (ICPR 2006), 20-24 August 2006, Hong Kong, China}, publisher = {IEEE Computer Society}, isbn = {0-7695-2521-0}, }