Augusli Kifli, Kun-Cheng Wu. SoC test integration platform. In VLSI Design, Automation and Test, VLSI-DAT 2015, Hsinchu, Taiwan, April 27-29, 2015. pages 1-2, IEEE, 2015. [doi]
@inproceedings{KifliW15,
title = {SoC test integration platform},
author = {Augusli Kifli and Kun-Cheng Wu},
year = {2015},
doi = {10.1109/VLSI-DAT.2015.7114546},
url = {http://dx.doi.org/10.1109/VLSI-DAT.2015.7114546},
researchr = {https://researchr.org/publication/KifliW15},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {VLSI Design, Automation and Test, VLSI-DAT 2015, Hsinchu, Taiwan, April 27-29, 2015},
publisher = {IEEE},
isbn = {978-1-4799-6275-4},
}