Kazuhiro Kikuma, Takeshi Yamada, Koki Sato, Kiyoshi Ueda. Preparation Method in Automated Test Case Generation using Machine Learning. In Proceedings of the Tenth International Symposium on Information and Communication Technology, Ha Noi, Ha Long Bay, Vietnam, December 4-6, 2019. pages 393-398, ACM, 2019. [doi]
Abstract is missing.