Testing analog circuits by supply voltage variation and supply current monitoring

Yavuz Kiliç, Mark Zwolinski. Testing analog circuits by supply voltage variation and supply current monitoring. In Proceedings of the IEEE 1999 Custom Integrated Circuits Conference, CICC 1999, San Diego, CA, USA, May 1649,1999. pages 155-158, IEEE, 1999. [doi]

Authors

Yavuz Kiliç

This author has not been identified. Look up 'Yavuz Kiliç' in Google

Mark Zwolinski

This author has not been identified. Look up 'Mark Zwolinski' in Google