Changhyun Kim. Future Memory Technology Trends and Challenges. In 7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA. pages 513, IEEE Computer Society, 2006. [doi]
@inproceedings{Kim06:50,
title = {Future Memory Technology Trends and Challenges},
author = {Changhyun Kim},
year = {2006},
doi = {10.1109/ISQED.2006.69},
url = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2006.69},
researchr = {https://researchr.org/publication/Kim06%3A50},
cites = {0},
citedby = {0},
pages = {513},
booktitle = {7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2523-7},
}