Soo Ye Kim, Jianming Zhang 0001, Simon Niklaus, Yifei Fan, Simon Chen, Zhe Lin 0001, Munchurl Kim. Layered Depth Refinement with Mask Guidance. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022, New Orleans, LA, USA, June 18-24, 2022. pages 3845-3855, IEEE, 2022. [doi]
Abstract is missing.