Keynote address tuesday: Challenges in mobile devices: Process, design and manufacturing

Kwang Hyun Kim. Keynote address tuesday: Challenges in mobile devices: Process, design and manufacturing. In 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. pages 8, IEEE Computer Society, 2013. [doi]

@inproceedings{Kim13-49,
  title = {Keynote address tuesday: Challenges in mobile devices: Process, design and manufacturing},
  author = {Kwang Hyun Kim},
  year = {2013},
  doi = {10.1109/TEST.2013.6651871},
  url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2013.6651871},
  researchr = {https://researchr.org/publication/Kim13-49},
  cites = {0},
  citedby = {0},
  pages = {8},
  booktitle = {2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013},
  publisher = {IEEE Computer Society},
}