Hyunjin Kim, Jacob A. Abraham. On-chip source synchronous interface timing test scheme with calibration. In Wolfgang Rosenstiel, Lothar Thiele, editors, 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012. pages 1146-1149, IEEE, 2012. [doi]
No reviews for this publication, yet.