Byoungho Kim, Jacob A. Abraham. Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded Systems. IEEE Trans. on Circuits and Systems, 60-II(5):257-261, 2013. [doi]
@article{KimA13-1,
title = {Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded Systems},
author = {Byoungho Kim and Jacob A. Abraham},
year = {2013},
doi = {10.1109/TCSII.2013.2251953},
url = {http://dx.doi.org/10.1109/TCSII.2013.2251953},
researchr = {https://researchr.org/publication/KimA13-1},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {60-II},
number = {5},
pages = {257-261},
}