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Byoungho Kim, Jacob A. Abraham. Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded Systems. IEEE Trans. on Circuits and Systems, 60-II(5):257-261, 2013. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Testing Software Requirements with Z and Statecharts Applied to an Embedded Control SystemHye Yeon Kim, Frederick T. Sheldon. sqj, 12(3):231-264, 2004. [doi] Bitstream-Driven Built-In Characterization for Analog and Mixed-Signal Embedded CircuitsByoungho Kim, Jacob A. Abraham. tcas, 61-II(10):743-747, 2014. [doi]
The following publications are possibly variants of this publication: