Device instability of amorphous InGaZnO thin film transistors with transparent source and drain

Sang-Min Kim, Min-Ju Ahn, Won-Ju Cho, Jong-Tae Park. Device instability of amorphous InGaZnO thin film transistors with transparent source and drain. Microelectronics Reliability, 64:575-579, 2016. [doi]

Abstract

Abstract is missing.