Sungshin Kim, Hyeon Bae, Seong-Pyo Cheon, Kwang-Baek Kim. On-line Fabric-Defects Detection Based on Wavelet Analysis. In Osvaldo Gervasi, Marina L. Gavrilova, Vipin Kumar, Antonio Laganà , Heow Pueh Lee, Youngsong Mun, David Taniar, Chih Jeng Kenneth Tan, editors, Computational Science and Its Applications - ICCSA 2005, International Conference, Singapore, May 9-12, 2005, Proceedings, Part IV. Volume 3483 of Lecture Notes in Computer Science, pages 1075-1084, Springer, 2005. [doi]
Abstract is missing.