Channel detection in microscope images of materials using marked point process modeling

Dae-Woo Kim, Mary L. Comer. Channel detection in microscope images of materials using marked point process modeling. In 2015 IEEE International Conference on Image Processing, ICIP 2015, Quebec City, QC, Canada, September 27-30, 2015. pages 3054-3058, IEEE, 2015. [doi]

Abstract

Abstract is missing.