Hyunjin Kim, Jaeyong Chung, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo. A Built-In Self-Test scheme for high speed I/O using cycle-by-cycle edge control. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 145-150, IEEE Computer Society, 2010. [doi]
@inproceedings{KimCABW10,
title = {A Built-In Self-Test scheme for high speed I/O using cycle-by-cycle edge control},
author = {Hyunjin Kim and Jaeyong Chung and Jacob A. Abraham and Eonjo Byun and Cheol-Jong Woo},
year = {2010},
doi = {10.1109/ETSYM.2010.5512766},
url = {http://dx.doi.org/10.1109/ETSYM.2010.5512766},
tags = {testing},
researchr = {https://researchr.org/publication/KimCABW10},
cites = {0},
citedby = {0},
pages = {145-150},
booktitle = {15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-5833-2},
}