Taehoon Kim, Jongwook Choi, Hyunjin Cho, HyoungJun Lim, Jongwon Choi. Domain Generalization for Face Forgery Detection by Style Transfer. In IEEE International Conference on Consumer Electronics, ICCE 2024, Las Vegas, NV, USA, January 6-8, 2024. pages 1-5, IEEE, 2024. [doi]
@inproceedings{KimCCLC24,
title = {Domain Generalization for Face Forgery Detection by Style Transfer},
author = {Taehoon Kim and Jongwook Choi and Hyunjin Cho and HyoungJun Lim and Jongwon Choi},
year = {2024},
doi = {10.1109/ICCE59016.2024.10444215},
url = {https://doi.org/10.1109/ICCE59016.2024.10444215},
researchr = {https://researchr.org/publication/KimCCLC24},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Conference on Consumer Electronics, ICCE 2024, Las Vegas, NV, USA, January 6-8, 2024},
publisher = {IEEE},
isbn = {979-8-3503-2413-6},
}